Etiqueta de registo: 00661cam 2200229 450
001 1708037
003 http://id.bnportugal.gov.pt/bib/porbase/1708037
005 20030629084900.0
010 ## $a0-306-35728-3
035 ## $977593
095 ## $aPTBN00988839
100 ## $a19970424d1978 k y0pory0103 ba
101 0# $aeng
102 ## $aUS
200 1# $aMaterial characterization using ion beams$fed. J. P. Thomas, A. Cachard
210 ## $aNew York$cPlenum,$d1978
215 ## $aXVIII, 517 p
225 2# $aNato ASI$iSeries B$v28
675 ## $a539.2$v2ª med.$zpor$3291219
702 #1 $aCachard,$bA.$4340$31383181
702 #1 $aThomas,$bJ. P.$4340$31383182
801 #0 $aPT$bBN$gRPC
977 ## $1COL$2coop$4UCDF$6efalt281770$7bc$8coop$9UCDF$b62848$k0
998 ## $aCDF23-412