Etiqueta de registo: 00844cam 2200217 450
001 1762613
003 http://id.bnportugal.gov.pt/bib/porbase/1762613
005 20030621134000.0
035 ## $865177
095 ## $aPTBN00620817
100 ## $a19901220d19779999k y0pory0103 ba
101 0# $aeng
102 ## $aUS
200 1# $aLifetimes of the 569.6 keV Level in 207 Pb and 1757 keV level in 116 Sn and tests of the methods of analysis of picosecond lifetimes$fErmelinda Pedroso de Lima
210 ## $aNashville, Tennessee$cVanderbilt University,$d1977
215 ## $a54 p
328 ## $aTese: Master of Science in Physics: Faculty of the Graduate School of Vanderbilt University, Nashville, Tennessee
675 ## $a539.1$vBN$zpor$3292055
675 ## $a042: 539.1$v2ª média$zpor$31418135
700 #1 $aLima,$bErmelinda Pedroso de$3779706
801 #0 $aPT$bBN$gRPC
977 ## $1539.1 LIM$2coop$4UCDF$6mq1355219$7bc$8coop$9UCDF$b63020$cFotocop$k0
998 ## $aUCF1-425