Etiqueta de registo: 00609cam 2200205 450
001 1842196
003 http://id.bnportugal.gov.pt/bib/porbase/1842196
005 20030531062200.0
035 ## $648243
095 ## $aPTBN00859961
100 ## $a19940131d1993 k h0pory0103 ba
101 0# $aeng
102 ## $aFR
200 1# $aObjectives and general safety principles for future PWRs$fJ. Brisbois
210 ## $aParis$cInstitut de Protection et de Sureté Nucléaire,$d1993
215 ## $a6 p
225 2# $aRapport DES$v151e
675 ## $a621.039$vBN$zpor$3291845
700 #1 $aBrisbois,$bJ.$3304809
801 #0 $aPT$bBN$gRPC
977 ## $1AB-06-472$2coop$4UAVSD$6mq1044564$7bc$8coop$9UAVSD$b75706$k0
998 ## $aUAV58-473

Etiqueta de registo: 00616cam 22002171 450
001 1835189
003 http://id.bnportugal.gov.pt/bib/porbase/1835189
005 20030607183700.0
010 ## $a0-442-20352-7
035 ## $791709
095 ## $aPTBN00579629
100 ## $a19890927d1972 k y0pory0103 ba
101 0# $aeng
102 ## $aUS
200 1# $aMOS integrated circuits
210 ## $aNew York$cVan Nostrand Reinhold,$d1972
215 ## $aXVII, 474 p
225 2# $aMicroelectronics series
675 ## $a621.3 (094.5)$vBN$zpor$3292154
710 02 $aEngineering Staff of American Micro-Systems$31460059
801 #0 $aPT$bBN$gRPC
977 ## $1ET-04-26$2coop$4UAVSD$6mq1245194$7bc$8coop$9UAVSD$b793$k0
998 ## $aUAV23-33