Etiqueta de registo: 00284nx b22000853 45
001 573033
100 ## $a19890804apora0103 ba0
152 ## $aRPC
210 12 $aInternational Conference on The Impact of Transmission Electron Microscopy on Theories of the Strenght of Crystals,$d1,$eCalifornia,$f1961
801 #0 $aPT$bBN
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